Untrusted Pointer Dereference in Automotive Android OS
Memory corruption can occur when a compat IOCTL call is followed by a normal IOCTL call from userspace.
Memory corruption can occur when a compat IOCTL call is followed by a normal IOCTL call from userspace.
Transient DOS while parsing the ML IE when a beacon with common info length of the ML IE greater than the ML IE inside which this element is present.
Memory corruption when allocating and accessing an entry in an SMEM partition continuously.
Memory corruption while Configuring the SMR/S2CR register in Bypass mode.
Transient DOS while parsing the multiple MBSSID IEs from the beacon, when the tag length is non-zero value but with end of beacon.
Transient DOS when driver accesses the ML IE memory and offset value is incremented beyond ML IE length.
Transient DOS while parsing the MBSSID IE from the beacons, when the MBSSID IE length is zero.
Transient DOS while parsing fragments of MBSSID IE from beacon frame.
Memory corruption during session sign renewal request calls in HLOS.
Memory corruption when keymaster operation imports a shared key.
Transient DOS while importing a PKCS#8-encoded RSA key with zero bytes modulus.
Memory corruption when IOMMU unmap operation fails, the DMA and anon buffers are getting released.
Memory corruption when an invoke call and a TEE call are bound for the same trusted application.
Memory corruption while processing key blob passed by the user.
Memory corruption while performing finish HMAC operation when context is freed by keymaster.
Transient DOS while parsing ESP IE from beacon/probe response frame.
Transient DOS while parsing SCAN RNR IE when bytes received from AP is such that the size of the last param of IE is less than neighbor report.
Transient DOS while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
Transient DOS while parsing the ML IE when a beacon with length field inside the common info of ML IE greater than the ML IE length.