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CVE-2022-33257

Time-of-check time-of-use race condition in Core

Memory corruption in Core due to time-of-check time-of-use race condition during dump collection in trust zone.

CVSS 3.1 · 9.3 Critical EPSS < 1% KEV · Not listed
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CVE-2022-33250

Reachable assertion in Modem

Transient DOS due to reachable assertion in modem when network repeatedly sent invalid message container for NR to LTE handover.

CVSS 3.1 · 7.5 High EPSS < 1% KEV · Not listed
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CVE-2022-33248

Integer overflow to buffer overflow in User Identity Module

Memory corruption in User Identity Module due to integer overflow to buffer overflow when a segement is received via qmi http.

CVSS 3.1 · 7.8 High EPSS < 1% KEV · Not listed
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CVE-2022-33242

Improper authentication in Qualcomm IPC

Memory corruption due to improper authentication in Qualcomm IPC while loading unsigned lib in audio PD.

CVSS 3.1 · 7.8 High EPSS < 1% KEV · Not listed
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CVE-2022-33232

Buffer copy without checking size of input in Hypervisor

Memory corruption due to buffer copy without checking size of input while running memory sharing tests with large scattered memory.

CVSS 3.1 · 9.3 Critical EPSS < 1% KEV · Not listed
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CVE-2022-33221

Buffer over-read in Trusted Execution Environment

Information disclosure in Trusted Execution Environment due to buffer over-read while processing metadata verification requests.

CVSS 3.1 · 6.8 Medium EPSS < 1% KEV · Not listed
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CVE-2022-25713

Improper Restriction of Operations within the Bounds of a Memory Buffer in Automotive

Memory corruption in Automotive due to Improper Restriction of Operations within the Bounds of a Memory Buffer while exporting a shared key.

CVSS 3.1 · 7.8 High EPSS < 1% KEV · Not listed
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CVE-2022-25706

Information disclosure in Bluetooth driver due to buffer over-read while reading l2cap length in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

CVSS 3.1 · 8.2 High EPSS < 1% KEV · Not listed
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CVE-2022-25696

Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

CVSS 3.1 · 8.4 High EPSS < 1% KEV · Not listed
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