There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.
History

No history.

cve-icon MITRE

Status: PUBLISHED

Assigner: qualcomm

Published: 2019-02-11T15:00:00

Updated: 2024-08-05T09:14:47.275Z

Reserved: 2018-07-11T00:00:00

Link: CVE-2018-13888

cve-icon Vulnrichment

No data.

cve-icon NVD

Status : Analyzed

Published: 2019-02-11T15:29:00.740

Modified: 2019-02-14T18:21:02.493

Link: CVE-2018-13888

cve-icon Redhat

No data.