The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.
Advisories
Source ID Title
EUVD EUVD EUVD-2022-38731 The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.
Fixes

Solution

No solution given by the vendor.


Workaround

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cve-icon MITRE

Status: PUBLISHED

Assigner: mitre

Published:

Updated: 2024-08-03T09:44:22.150Z

Reserved: 2022-07-13T00:00:00

Link: CVE-2022-35858

cve-icon Vulnrichment

No data.

cve-icon NVD

Status : Modified

Published: 2022-08-04T20:15:20.013

Modified: 2024-11-21T07:11:49.500

Link: CVE-2022-35858

cve-icon Redhat

No data.

cve-icon OpenCVE Enrichment

No data.

Weaknesses