Transient DOS while parsing the EPTM test control message to get the test pattern.
Advisories
Source ID Title
EUVD EUVD EUVD-2025-30986 Transient DOS while parsing the EPTM test control message to get the test pattern.
Fixes

Solution

No solution given by the vendor.


Workaround

No workaround given by the vendor.

History

Thu, 25 Sep 2025 08:30:00 +0000

Type Values Removed Values Added
First Time appeared Qualcomm
Qualcomm snapdragon
Vendors & Products Qualcomm
Qualcomm snapdragon

Wed, 24 Sep 2025 18:15:00 +0000

Type Values Removed Values Added
Metrics ssvc

{'options': {'Automatable': 'yes', 'Exploitation': 'none', 'Technical Impact': 'partial'}, 'version': '2.0.3'}


Wed, 24 Sep 2025 15:45:00 +0000

Type Values Removed Values Added
Description Transient DOS while parsing the EPTM test control message to get the test pattern.
Title Buffer Over-read in BT Controller
Weaknesses CWE-126
References
Metrics cvssV3_1

{'score': 7.5, 'vector': 'CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H'}


cve-icon MITRE

Status: PUBLISHED

Assigner: qualcomm

Published:

Updated: 2025-09-24T17:28:16.793Z

Reserved: 2025-05-06T08:33:16.260Z

Link: CVE-2025-47318

cve-icon Vulnrichment

Updated: 2025-09-24T17:28:14.030Z

cve-icon NVD

Status : Awaiting Analysis

Published: 2025-09-24T16:15:37.100

Modified: 2025-09-24T18:11:24.520

Link: CVE-2025-47318

cve-icon Redhat

No data.

cve-icon OpenCVE Enrichment

Updated: 2025-09-25T08:21:35Z