On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.
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Fri, 05 Sep 2025 18:15:00 +0000
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Fri, 05 Sep 2025 17:30:00 +0000
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Description | On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible. | |
Title | NRF52810 Runtime EM Fault Injection APPROTECT Bypass | |
Weaknesses | CWE-1191 CWE-1319 |
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cvssV4_0
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Status: PUBLISHED
Assigner: Toreon
Published:
Updated: 2025-09-05T18:07:49.930Z
Reserved: 2025-08-29T16:27:34.512Z
Link: CVE-2025-9709

Updated: 2025-09-05T18:07:43.143Z

Status : Received
Published: 2025-09-05T18:15:50.927
Modified: 2025-09-05T18:15:50.927
Link: CVE-2025-9709

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