On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.
History

Fri, 05 Sep 2025 18:15:00 +0000

Type Values Removed Values Added
Metrics ssvc

{'options': {'Automatable': 'no', 'Exploitation': 'poc', 'Technical Impact': 'total'}, 'version': '2.0.3'}


Fri, 05 Sep 2025 17:30:00 +0000

Type Values Removed Values Added
Description On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.
Title NRF52810 Runtime EM Fault Injection APPROTECT Bypass
Weaknesses CWE-1191
CWE-1319
References
Metrics cvssV4_0

{'score': 8.6, 'vector': 'CVSS:4.0/AV:P/AC:L/AT:N/PR:N/UI:N/VC:H/VI:H/VA:H/SC:H/SI:H/SA:H/S:P'}


cve-icon MITRE

Status: PUBLISHED

Assigner: Toreon

Published:

Updated: 2025-09-05T18:07:49.930Z

Reserved: 2025-08-29T16:27:34.512Z

Link: CVE-2025-9709

cve-icon Vulnrichment

Updated: 2025-09-05T18:07:43.143Z

cve-icon NVD

Status : Received

Published: 2025-09-05T18:15:50.927

Modified: 2025-09-05T18:15:50.927

Link: CVE-2025-9709

cve-icon Redhat

No data.

cve-icon OpenCVE Enrichment

No data.