Impact
CWE‑415 double‑free occurs when the Broadcom AFBR‑S50 sensor driver processes a data‑ready event and the sensor evaluation fails. The failure path finalizes the same RTIO submission twice—once as an error, then as a success—causing the submission object to be returned to the pool, freed, and later used again. This results in stale data being written through a released buffer and duplicate completion callbacks being delivered to the application, effectively corrupting the RTIO pool bookkeeping and provoking memory corruption. The impact is loss of application availability and data integrity; there is no direct code‑execution path because the attacker cannot control the corrupted content. The flaw arises from a logic error in data_ready_work_handler() that omits a return statement after handling an error. As a result, the function falls through to the success code path, double‑finalizing the same RTIO object. The vulnerability is categorized as CWE‑415: Double Free.
Affected Systems
The affected product is the Broadcom AFBR‑S50 time‑of‑flight sensor driver compiled for the Zephyr RTOS (zephyrproject:zephyr). Any Zephyr build that enables this driver—the brcm,afbr‑S50 sensor module—is susceptible. No specific version range is listed, so all releases prior to the fixed commit are affected.
Risk and Exploitability
The CVSS score of 5.2 indicates moderate severity. The EPSS score is not available, but the lack of a KEV listing suggests that no public exploits are known. The likely attack vector is physical proximity to the sensor; a nearby party can induce sensor error conditions (harsh ambient light or SPI transfer errors) without having software access or physical contact with the board. Because the flaw merely corrupts memory and leads to denial of service, the threat is limited to availability disruption on the affected device.
OpenCVE Enrichment